EQ-XRF-32-LD is high throughput 32-sample X-ray fluorescence (XRF) / energy dispersive spectrometer (EDS) system ( Made by Olympus ) for non-destructive composition analysis. The station integrates a handheld XRF spectrometer with XY stage, 32-sample station, and laptop remote control. It enables quick and easy composition analysis of samples (elements from Mg to Bi), with concentrations as low as 0.01%. The system automation provides 32-sample testing, analysis, and result output in one autorun with the push of a single button. It is an excellent tool for high throughput research and development of powder and bulk materials, for applications such as high-entropy alloys, novel magnetic materials, solid ceramic electrolyte materials, etc
SPECIFICATIONS:Features
| - The high throughput XRF station consists of:
- Handheld XRF spectrometer made by Olympus.
- XRF spectrometer holder and triggering mechanism
- XY stage system and its control box
- 32-position transparent sample stage (no interference to XRF signal)
- Laptop with pre-installed control and analysis software
- Station cabinet with warning lights and lead glass for X-ray safety
- The automatic operation improves efficiency, reduces operator-related error, and minimizes X-ray exposure
- Fast, automatic XRF measurement and analysis of 32 samples (~20 min depending on the testing time), and automatic output of composition/spectrum data via a USB port
- The XRF system can be upgraded with 1D line scan and 2D mapping scan features at the extra cost
- Please contact MTI for system customization, such as sample stage with different dimensions, integration of the station with a glove box, etc
| | Power Input | | XRF Spectrometer
 
| - X-ray Source:
- X-ray tube: 4 W Rh target X-ray tube (optional Ag, Au, or Ta target available)
- Voltage: 40 kV max (50 kV option available)
- Current: 200 μA max
- Spot size: 3 mm (with collimator) and 9 mm
- Window Material: Beryllium (Be)
- Window guard: Kapton and Prolene window protection films
- Detector:
- SDD (Silicon drift detector): High energy resolution (165 eV FWHM) for general detection covering the whole element range
- Detector size: 25 mm2 large area detector for high count rate
- Window Material: Beryllium (Be)
- Features:
- An element library for alloy elements are pre-installed: Mg, Al, Si, P, S, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Hr, Ta, W, Re, Pb, Bi (Customized element library is available upon request)
- Integrated CMOS camera for observing the measurement area on the sample surface
- Built-in sample proximity sensor to close X-ray shutter if no sample is detected near the detector
- USB / Bluetooth connection to a laptop for remote control and data output
| XRF Holder & Trigger
| - A XRF spectrometer holder with trigger-pressing mechanism is integrated into the system for continuous, automatic measurement
- The XRF measurement time can be controlled by setting the press-down time of the trigger mechanism
| XY Sample Stage
  
| - Touch screen controlled XY stage for precise sample positioning and measurement repeatability
- XRF measurement time, X- / Y- axis travel speed, sample selections can be configured on the control box touch screen
- 32-sample transparent stage (no interference to XRF signal) for as-received arc melting samples (≤10 g) (max sample size: 20 mm) is included.
- The sample is supported by XRF transparent Prolene film for maximized XRF signal
    | Station Cabinet
 
| - Station cabinet with warning lights and lead glass for X-ray operation safety
- XY stage control box is integrated into the station cabinet
- An optional high-accuracy digital Geiger counter/dosimeter can be mounted on the cabinet for monitoring the radiation level (Click the photo below)
 | XRF Control & Analysis
| - A laptop with pre-installed XRF control software and spectrum analysis software are included for XRF spectrometer remote control and data analysis
- The control/analysis software is capable of
- Adjust measurement settings: X-ray voltage/current, testing time, spot size, measurement repeats
- Real-time observation of measurement area on the sample surface using the integrated CMOS camera
- Default element library for alloy elements: Mg, Al, Si, P, S, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Hr, Ta, W, Re, Pb, Bi
- A customized element library (up to 40 elements) for ceramic analysis or other applications is available upon request
- Fundamental parameters analysis, both qualitatively and quantitatively
- Full correction on attenuation in air and absorption of window/window guard
- Auto-mode for continuous or repeated analysis
| Options
| - The XRF system can be upgraded with 1D line scan and 2D mapping scan features at extra cost
- Please contact MTI for system customization, such as sample stage with different dimensions, integration of the station with a glove box, etc
| | Net Weight | | Compliance
 
| - XRF spectrometer: CE, FCC (USA), ICES-001 (Canada) approval
- EQ-XRF-32-LD is CE certified.
| | Warranty | - One-year limited warranty with lifetime support
| Dimension
|  820 × 680 × 1200 mm (L × D × H) (Depth with door open: 1050mm)
| | Shipping Weight & Dimensions | | | Operation Video |  | Application Notes
 Pic. 1
| - You may use a 100T hydraulic press with a special die to prepare an XRF sample in high throughput (Pic. 1)
- Users must be trained in radiation safety and fully understand the radiation precautions and instructions provided
- Close the cabinet door and stay 0.5 m clear of the cabinet before conducting an XRF measurement to minimize radiation
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