Thermal Oxide Wafer 2" Dia.

Thermal Oxide Wafer: 300 nm SiO2 Layer on Si (100), 2" dia x 0.5 mm t, N type , undoped, R>1000 ohm-cm

Thermal Oxide Wafer: 300 nm SiO2 Layer on Si (100), 2" dia x 0.5 mm t, N type , undoped, R>1000 ohm-cm

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Product Name Thermal Oxide Wafer: 300 nm SiO2 Layer on Si (100), 2" dia x 0.5 mm t, N type , undoped, R>1000 ohm-cm
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Product Code Fm300SOonSIUa50D05C1R1000US
Quantity 수량증가수량감소
상품 옵션
 

     Thermal oxide Layer

  •           •  Research Grade, about 80 % useful  area
  •           •  SiO2 layer on 2" Silicon wafer
  •           •  Oxide layer thickness: 300 nm ( 3000A) +/-10%
  •           •  Refractive index- 1.455

     Silicon Wafer Specifications

  •           •  Conductive type:        N- type/ Un- doped
  •           •  Resistivity:                  >1000 ohm-cm
  •           •  Size:                          50.8 diameter +/- 0.5 mm x 0.5 +/- 0.025 mm
  •           •  Orientation:                (100) +/- 1o
  •           •  Polish:                        one side polished
  •           •  Surface roughnessm, Ra: < 5A(RMS)