Thermal Oxide Wafer 2" Dia.

Thermal Oxide Wafer: 300 nm SiO2 Layer on Si (100), 2" dia x 0.50 mm t, P type B doped, 1 side polished,R:0.001-0.005 ohm.cm

Thermal Oxide Wafer: 300 nm SiO2 Layer on Si (100), 2" dia x 0.50 mm t, P type B doped, 1 side polished,R:0.001-0.005 ohm.cm

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Product Name Thermal Oxide Wafer: 300 nm SiO2 Layer on Si (100), 2" dia x 0.50 mm t, P type B doped, 1 side polished,R:0.001-0.005 ohm.cm
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Product Code Fm300SOonSIBa50D05C1R0001US
Quantity 수량증가수량감소
상품 옵션
 

     Thermal oxide Layer

  •           •  Research Grade, about 80 % useful  area
  •           •  SiO2 layer on 2" Silicon wafer
  •           •  Oxide layer thickness: 300 nm ( 3000A) +/-10%
  •           •  Refractive index- 1.455

     Silicon Wafer Specifications

  •           •  Conductive type:  P type/ Boron doped
  •           •  Resistivity:           0.001- 0.005 ohm-cm
  •           •  Size:                    50.8 diameter +/- 0.5 mm x 0.50 +/- 0.025 mm
  •           •  Orientation:          (100) +/- 1o
  •           •  Polish:                  one side polished
  •           •  Surface roughness, Ra: < 5A (RMS)